基于機器視覺的圖像亞像素測量技術的應用研究

1、 論文題目：基于機器視覺的圖像亞像素測量技術的應用研究 專 業(yè)：通信與信息系統(tǒng) 碩 士 生： 吳軍妮 (簽名) 指導老師： 李白萍 （簽名） 摘 要 近年來隨著傳統(tǒng)制造業(yè)的轉型升級，工業(yè)自動化技術的大規(guī)模應用，尤其是在半導體和消費電子產業(yè)。產品大批量生產、對質量和加工精度要求越來越高。在

2、這種情況下要求檢測設備也要有很高的檢測速度和檢測精度。提高檢測精度可以采用更換硬件和優(yōu)化軟件兩種方法。但更換硬件代價較高，效果也并非很理想。所以在合理的范圍內，用軟件的方法提高檢測精度就成為一個重點研究方向。 本文開發(fā)了一款專業(yè)檢測軟件，可以檢測產品的尺寸以及 ROI 區(qū)域各種的缺陷。軟件通過 RS485 從 PLC 接受檢測信號，檢測結果也通過 RS485 傳送給 PLC，用于控制收料機對產品進行分類。由于泰勒多項式插值不依賴于插值像

3、素的坐標位置，抗噪性強、對圖像對比度的變化不敏感。所以本文將經典的雙線性插值與基于泰勒多項式的亞像素插值結合，提出了一種改進的泰勒亞像素插值算法。該算法對工業(yè)現(xiàn)場的噪聲、光照的變化（俗稱光害） 、產品的清潔狀況（被測的工件表面可能有一些污漬）具有一定的魯棒性，在計算結果精度和穩(wěn)定性提高的同時檢測速度沒有明顯下降。 銅帽（帶線）是半導體電子行業(yè)中常用的一種電子元器件，是生產多種電子產品的原始材料。它的加工精度和質量與最終的電子產品的壽命和

4、功耗有直接關系。本文結合蘇州福弘電子工業(yè)有限公司的銅帽（帶線）尺寸測量和缺陷檢測項目，將改進的泰勒亞像素插值算法應用到鉚點直徑和和錐點尺寸的測量中，與傳統(tǒng)的雙線性插值結果進行對比，計算精度和穩(wěn)定性有明顯提高。改進的算法在客戶工作現(xiàn)場的使用效果非常理想，微小的質量問題也檢測了出來，大大提高了產品的質量。 關 鍵 字: : 機器視覺；銅帽（帶線）檢測；泰勒亞像素插值 研究類型：應用研究 Subject : Research and Ap

5、plication of Image Sub-pixel Measurement Based on Machine Vision Specialty : Communication and Information System Name : Wu Junni (Signature) Instructor : Li Baiping

6、 (Signature) ABSTRACT With the development of the traditional manufacturing industry, Industrial automation technology’s large-scale application. Especially in the semiconductor and consumer e

7、lectronics industry, with the measurement precision, the products; quality, the detection speed needed is increasing. Require the detection device should have a high detection speed and detection precision. But simply in

8、crease the camera and the lens’ resolution to improve the detection precision, is not economical. So within a reasonable range, improve the detection precision of the method using the software is a very important develop

9、ment direction. This paper developed professional measure software, it can detect the size of the products and all kinds of defects in ROI areas. The software receives the detection signal from the PLC through the RS485,

10、 the results are sent to PLC through RS485, used to control the material receiving machine used to carries on the classification to the product. The taylor polynomial interpolation not depends on pixels’ coordinates, not

11、 sensitive to noise, also not sensitive to the change of the contrast of image. This paper combines the classical bilinear interpolation and Taylor-based sub-pixel interpolation to an improved taylor pixel interpolation

12、algorithm. The algorithm has certain robustness for noise and slight variations in illumination. Copper cap (with needle) is a commonly electronic component used in the semiconductor electronics industry. It’s machining

13、accuracy and quality are directly related to the final electronic product life and power consumption This paper led copper cap (with needle) measurement and defect detection project as an example, apply the improved tayl

14、or sub-pixel interpolation algorithm to cap’s inner diameter measurement and cone size measurement. Compared with the traditional bilinear Interpolation algorithm, the precision and stability have improved significantly.