寬帶交換機接入技術(shù)和測試技術(shù)的研究.pdf

1、Y771009後多大學(xué)碩士學(xué)位論文學(xué)投代俏：1026學(xué)1j：TOZt02042寬帶交換機接入技術(shù)和測試技術(shù)的研究院系：專業(yè)：蚓名：指導(dǎo)教舾：指導(dǎo)教師：完成日期：信息利學(xué)’了1j程學(xué)院乜予弓通訊二[_穰朱彬慶包閣亮教授(復(fù)望)乍榮高一(公t司)2004年l】月18目復(fù)吼大學(xué)碩士學(xué)位論文TheResearchForAccessTechnologyAndTestTechnologyofBoardBandExchangerA3STRACTThe

2、mainresearchobjectofthisthesisisthenewgenerationBroadbandExchanger一P3Star。Exceptforthebriefpresentationfortheworkingtheory，functionandsystemconfigurationoftheP3Star，thethesismakesdetailanalysisontheInterworkingLinkTermin

3、ationModule(B32I張)anditsappliqu6board(BA32IWA)Nowadays，therearetotallyfourkindsofappliqu6boardofP3StarthatareproducedinAlcatel—ShanghaiBellAmongwhichtheyieldofBA32IWEtakestheproportionover69％Onaccountofthehugeoutputamoun

4、tandcomplextestproduceofBA32I她，theproductionofthisboardisalwaysblockedinlinewiththetoolonglead—timeSothemaintaskofthisstudyistedesignthetestplatformtogetherwith鼴勢engineerSOaStothebottleneckandexpendthetestcapacityfinally

5、ThetargetofthestudyingistobuildupacomputerizedsystemthatiSabletotestabatchofboardatthesametimewithoutchangingtheoriginalcircuitandprocessofB32IWEandBA32IWAConcretely，thenewtestsystemwillexpendtestquantityperbatchfromoneb

6、oardto8，16boardsormore。Accordingly，thetesttimeperboardwillbedecreasedfrom20minto3minduetothenewsystemAsaresult，theoutputwillincreaseatotfromthebenefitofthenewsystemaswellastheimprovementofutilizedrateoftestequipmentKEYWO