鍺膜的折射率溫度系數(shù)的理論建模與實(shí)驗(yàn)測量.pdf

1、分類號(hào)UDC密級(jí).學(xué)校代碼10497Hif^^f學(xué)位論文題目鍺膜的折射率溫度系數(shù)的理論建模與實(shí)驗(yàn)測量英文題巨Thetheeticmodelingexperimentalmeasurementofthethermoopticcoefficientfgermaniumfilm研究生姓名姓名黎敏職稱教授學(xué)位博士指導(dǎo)教師單位名稱武漢理工大學(xué)理學(xué)院物理系郵編430070姓名職稱學(xué)位副指導(dǎo)教師單位名稱郵編申請(qǐng)學(xué)位級(jí)別碩士學(xué)科專業(yè)名稱

2、光學(xué)指導(dǎo)教師論文提交日期2012年4月論文答辯日期2012年5月曰學(xué)位授予單位武漢理工大學(xué)學(xué)位授予日期答辯委員會(huì)主席評(píng)閱人U^v2012年4月iiABSTRACTThisassayusedKramersKronigfmulatoconnectsemiconductsrefractiveindexwiththeirabsptioncoefficientthusgaveastudyonrefractiveindexthroughthes

3、tudyonabsptioncoefficient.Thisassayproposedatheeticalmodelofthetemperaturecoefficientofasemiconductsrefractivecoefficientatitsabsptionlimit(dndT)bydividingdndTintotwoparts:enhancedpart(dAnldT)unenhancedpart(d△n2dT)thenst

4、udycalculateseparately.Thismodelshowsaconsistanttrendofsemiconudctscalescencecoefficientatstudycondition.Inadditiontotheeticwkthisassayalsoproposedanewlabtestingmethodftemperaturecoefficientofsemiconductsrefractiverate.I

5、nthisnewmethodtheanalyzercanplatethesemiconduct(germaniumwasusedinourtest)asathinfilmontheendofthesinglemodeopticalfibermeasuretherefractivecoefficientwhenthesemiconductisatdifferenttemperaturecalculatethetemperaturecoef

6、ficientoftheconductsrefractiverate.Theauthdiditsanalysisonanemulationalexperimentofsemiconductfilmtheresultshowedthatthefilmthicknesshadagreateffectonexperimentalsensitivityalsothetheeticalcalculation.Tomakesuretheopticq

7、uality(refractiverateandabsption)ofplatedconductfilminthiscaseplategermaniumfilmisclosetostardgermaniumwemadegermaniumfilmsusingdifferentplatingmethodsmethodoneismagronsputteringplatingmethodtwoisvacuumevapatingplating.T

8、hesemiconductsopticalconstantbytwomethodsthenwasanalyzesbyhighprecisionellipsometerytestingresultshowedthatmethodtwoprovidedagermaniumfilmwhoseopticalconstantisclosertostandardgermaniums.KeyWds:thermoopticcoefficientabsp